Dow Duroptix JCR 6109 Datasheet Dow Duroptix JCR 6109

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  • Description for Dow Duroptix JCR 6109

    One-part clear, low viscosity, optical gel, silicone LED (light emitting diode) encapsulants are designed to meet the challenging needs of the LED market, high purity, moisture resistance, thermal stability and optical transmittance.

    *See Terms of Use Below

    Application Type Encapsulant
    1 Part or 2 Part 1-Part
    Material Form Gel
    Industry Light Emitting Diodes (LEDs), Optical encapsulant, Bonding wires
    Manufacturer Dow
    Chemistry High purity, Methyl phenyl siloxane, Non solvent
    Cure Method Heat curing
    Cure Temperature (°C) 70, 150
    Cure Time (min) 60, 960
    Viscosity (cPs) 3,700, Low
    Color Translucent
    High Temperature Resistance (°C) 200
    Low Temperature Resistance (°C) -45
    Volume Resistivity (O) 1.7E+15 (ohm*cm)
    Light Refractive Index (RI) 1.4200
  • Technical Data for Dow Duroptix JCR 6109

    Overview
    • Application Type
    • 1 Part or 2 Part
      • 1-Part
    • Material Form
      • Gel
    • Industry
      • Optical - Optical encapsulant
      • LED (Light-Emitting Diodes) - Light Emitting Diodes (LEDs)
      • Wirebond - Bonding wires
    • Chemistry
    • Cure Method
      • Heat - Heat curing
    • Color
      • Translucent
    Specifications
    Cure Specs
    Cure Temperature (°C) 70, 150 Test Method
    Cure Time (min) 60, 960 Test Method
    Viscosity (cPs) 3,700, Low Test Method
    Work / Pot Time (min) Long
    Material Resistance
    High Temperature Resistance (°C) 200
    Low Temperature Resistance (°C) -45
    Conductivity
    Dissipation Factor 5.5E-04 Test Method
    Dielectric Strength (V/mil) 0.01 Test Method
    Dielectric Constant 2.70 Test Method
    Thermal Conductivity (W/m°K) Excellent thermal stability
    Volume Resistivity (O) 1.7E+15 (ohm*cm) Test Method
    Hardness
    Flexibility Flexible
    Modulus (psi) 0.05 (Mpa) Test Method
    Other Properties
    Light Refractive Index (RI) 1.4200 Test Method
    Specific Gravity 1.040 Test Method
    Business Information
    Shelf Life Details Shelf life is indicated by the “Use Before” date found on the product label. For best results, DuPont one-part products require cold storage at or below -5°C (23°F). Special precautions must be taken to prevent moisture from contacting these materials. Containers should be kept tightly closed with head space minimized. Partially filled containers should be purged with dry air or other gases, such as nitrogen. Check the product label for specific storage conditions.
    Shelf Life Temperature (°F) 23
    Shelf Life Type From date of manufacture
    Shelf Life (mon) 6
  • Best Practices for Dow Duroptix JCR 6109

    *See Terms of Use Below

    1. Surface Preparation

      Surfaces should be clean and dry. Recommended cleaning methods include Dow Corning® brand OS Fluids, naphtha, mineral spirits, methyl ethyl ketone (MEK) or other suitable solvent. Rougher surfaces tend to promote adhesion of silicones to other surfaces.

    2. Clean-Up

      These products can be dispensed or molded depending on the product and application. OS Fluids are recommended to clean cured or uncured silicone residue from application equipment.

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Cure Temperature Test Methods
Cure Temperature Cure Time Test Method
70°C These values are not intended for use in .preparing specifications.
150°C These values are not intended for use in preparing specifications.
Cure Time Test Methods
Cure Time Test Method
60 min These values are not intended for use in .preparing specifications.
960 min These values are not intended for use in preparing specifications.
Viscosity Test Methods
Viscosity Test Method
3,700 cPs These values are not intended for use in preparing specifications.
Low
Dielectric Constant Test Methods
Dielectric Constant Test Method
2.70 At 1MHz, these values are not intended for use in preparing specifications.
Dielectric Strength Test Methods
Dielectric Strength Test Method
0.01 V/mil These values are not intended for use in preparing specifications.
Dissipation Factor Test Methods
Dissipation Factor Test Method
5.5E-04 At 1MHz, These values are not intended for use in preparing specifications
Volume Resistivity Test Methods
Volume Resistivity Test Method
1.7E+15 (ohm*cm) These values are not intended for use in preparing specifications.
Modulus Test Methods
Modulus Test Method
0.05 (Mpa) Youngs modulus, These values are not intended for use in preparing specifications
Light Refractive Index (RI) Test Methods
Light Refractive Index (RI) Test Method
1.4200 These values are not intended for use in preparing specifications.
Specific Gravity Test Methods
Specific Gravity Test Method
1.040 Cured, These values are not intended for use in preparing specifications.