

-
Description for Dow Dowsil JCR 6126 WC Encapsulant
• Two-part • Thixotropic • Very long working time • Medium-modulus • Optically clear • Controlled flow • Seal and protect LEDsBrand Dowsil Application Type Encapsulant, Seal 1 Part or 2 Part 2-Part Material Form Liquid, Silicone elastomer Industry Optoelectronic packaging, Light Emitting Diodes (LEDs), Displays, Protecting the bonding wires, Micro-electronic packaging, Protect LEDs, Protecting the chip, Seal LEDs Manufacturer Dow Chemistry Silicone elastomer, Solvent-free Cure Method 2-Part Cure, Heat cure, Oven Cure Temperature (°C) 150 Cure Time (min) 60 Viscosity (cPs) 86,400, 91,800, Controlled flow Color Translucent, Clear / Transparent: Optically clear High Temperature Resistance (°C) 200 Low Temperature Resistance (°C) -45 Volume Resistivity (O) 3.4E15 (ohm*cm) Stress Relief Absorb the stress caused by CTE mismatches Light Refractive Index (RI) 1.4000, 1.3900, 1.3900 -
Technical Data for Dow Dowsil JCR 6126 WC Encapsulant
Overview
-
Application Type
- Pottant / Encapsulant - Encapsulant
- Sealant - Seal
-
1 Part or 2 Part
- 2-Part
-
Material Form
- Elastomer - Silicone elastomer
- Liquid
-
Industry
- Displays
- LED (Light-Emitting Diodes) - Light Emitting Diodes (LEDs), Seal LEDs, Protect LEDs
- Wirebond - Protecting the bonding wires
- Electronics - Optoelectronic packaging, Micro-electronic packaging, Protecting the chip
- Packaging - Micro-electronic packaging, Optoelectronic packaging
-
Chemistry
- Solvent-Free
- Silicone - Silicone elastomer
-
Application Method
- Dispenser - Commercially available equipment, Industry standard processes, Molded, Dispensed
-
Cure Method
- Heat - Heat cure, Oven
- 2-Part Cure
-
Color
- Translucent
- Clear / Transparent : Optically Clear
-
Brand
- Dowsil
Specifications
Cure Specs
Cure Temperature (°C) 150 Test Method Cure Time (min) 60 Test Method Viscosity (cPs) 86,400, 91,800, Controlled flow Test Method Work / Pot Time (min) Very long Thixotropic Thixotropic Mix Ratio 10:1 Bond Strength
General Bond Strength (psi) Excellent Tensile Strength (psi) 1.8 (Mpa) Material Resistance
High Temperature Resistance (°C) 200 Low Temperature Resistance (°C) -45 Moisture/Humidity Resistance Moisture resistance Conductivity
Dissipation Factor 0.00090 Test Method Insulation Resistance (O) Electrical stability Dielectric Strength (V/mil) Durable, 600, Thermal stability Test Method Dielectric Constant 2.80 Test Method Volume Resistivity (O) 3.4E15 (ohm*cm) Test Method Hardness
Stress Relief Absorb the stress caused by CTE mismatches Shore A Hardness 26 Test Method Elongation (%) 3 Flexibility Flexible Modulus (psi) Medium, 0.7 (Young's (MPa)), Low Test Method Other Properties
Glass Transition Temp (Tg) (°C) -121 Light Refractive Index (RI) 1.4000, 1.3900, 1.3900 Test Method Coefficient of Thermal Expansion (CTE) 300 (ppm/°C) Flash Point (°F) 212.0 % Solids (%) 100 Business Information
Shelf Life Details Shelf life is indicated by the “Use By” date found on the product label. Check the product label for specific storage conditions (one part products require cold storage). One-part products produced in Japan for export are shipped using dry ice. One-part products produced in the United States are shipped using blue ice. Shelf Life Type From date of manufacture Shelf Life (mon) 9 Not Good For
Don't Use For Chemicals, Organotin, Other organometallic compounds, Silicone rubber containing organotin catalyst, Sulfur, Polysulfides, Polysulfones, Other sulfur containing materials, Unsaturated hydrocarbon plasitcizers, Some solder flux residues Don't Use With Certain materials, Curing agents, Plasticizers -
-
Best Practices for Dow Dowsil JCR 6126 WC Encapsulant
-
Surface Preparation
Surfaces should be clean and dry. Recommended cleaning methods include Dow Corning® brand OS Fluids, naphtha, mineral spirits, methyl ethyl ketone (MEK) or other suitable solvent. Rougher surfaces tend to promote adhesion of silicones to other surfaces.
-
Application
Dow encapsulants are compatible with commercially available equipment and industry standard processes. The encapsulants can be dispensed, printed or liquid injection molded.
-
Curing
Full cure to achieve final properties can be achieved in standard forced-air convection ovens or many other oven configurations.
-
Clean-Up
Dow Corning OS Fluids are recommended to clean cured or uncured silicone residue from application equipment.
-
Testing
If a substrate or material is questionable with respect to potentially causing inhibition of cure, it is recommended that a small scale compatibility test be run to ascertain suitability in a given application. The presence of liquid or uncured product at the interface between the questionable substrate and the cured silicone indicates incompatibility and inhibition of cure.
-
-
Comparable Materials for Dow Dowsil JCR 6126 WC Encapsulant
Spec Engine® Results
Popular Articles
Testing the effectiveness of surface treatments
Read ArticleWhat Are the Differences Between Adhesives and Sealants?
Read ArticleSilicones in LED Lighting | Gluespec
Read ArticleInfographic: ENSURING A STRONG BOND - 6 Basic Methods of Surface Preparation
Read ArticleSponsored Articles
Unique Advantages of Contact Adhesives
Read ArticleUsing LOCTITE® 454™ is a Valid Option for Engineers Working with a Wide Variety of Materials
Read ArticleSylgard 184 by DOW is the Top Choice for a Transparent, Silicone Encapsulant. Read Why:
Read ArticleCase Study: Creating reliable, corrosion-free bonds with LORD® 406 acrylic adhesive
Read ArticleFeatured Ads

Cure Temperature Test Methods
Cure Temperature | Cure Time Test Method |
---|---|
150°C | Heat Cure, Specification Writers: These values are not intended for use in preparing specifications. |
Cure Time Test Methods
Cure Time | Test Method |
---|---|
60 min | Heat Cure, Specification Writers: These values are not intended for use in preparing specifications. |
Viscosity Test Methods
Viscosity | Test Method |
---|---|
86,400 cPs | Mixed, Specification Writers: These values are not intended for use in preparing specifications. |
91,800 cPs | After 24 hours, Specification Writers: These values are not intended for use in preparing specifications. |
Controlled flow |
Dielectric Constant Test Methods
Dielectric Constant | Test Method |
---|---|
2.80 | 1 MHz, Specification Writers: These values are not intended for use in preparing specifications. |
Dielectric Strength Test Methods
Dielectric Strength | Test Method |
---|---|
Durable | |
600 V/mil | Specification Writers: These values are not intended for use in preparing specifications. |
Thermal stability |
Dissipation Factor Test Methods
Dissipation Factor | Test Method |
---|---|
0.00090 | 1 MHz, Specification Writers: These values are not intended for use in preparing specifications. |
Volume Resistivity Test Methods
Volume Resistivity | Test Method |
---|---|
3.4E15 (ohm*cm) | Specification Writers: These values are not intended for use in preparing specifications. |
Modulus Test Methods
Modulus | Test Method |
---|---|
Medium | |
0.7 (Young's (MPa)) | |
Low | Young’s |
Shore A Hardness Test Methods
Shore A Hardness | Shore Hardness Test Method |
---|---|
26 | Durometer, JIS, Specification Writers: These values are not intended for use in preparing specifications. |
Light Refractive Index (RI) Test Methods
Light Refractive Index (RI) | Test Method |
---|---|
1.4000 | @ 632.8 nm, Specification Writers: These values are not intended for use in preparing specifications. |
1.3900 | @ 1321 nm, Specification Writers: These values are not intended for use in preparing specifications. |
1.3900 | @ 1554 nm, Specification Writers: These values are not intended for use in preparing specifications. |